| 摘要 |
The invention relates to testing a device under test -DUT- (10), comprising the steps of receiving a first data sequence (Y) from the DUT (10) in response to a first stimulus signal (T1), wherein the data of a plurality of internal data sequences (A, B, C, D) of the DUT (10) is compressed into the first data sequence (Y), comparing the first data sequence (Y) with expected data and for detecting errors (Y4, Y7) in the first data sequence (Y), and providing a second stimulus signal (T2) to the DUT (10) in order to instruct the DUT (10) to generate a second data sequence (Z) that comprises uncompressed data of the plurality of the internal data sequences (A, B, C, D) at the positions where the errors (Y4, Y7) have been detected.
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