| 摘要 |
LSI test equipment can acquire output data of an LSI as a device under test by a clock signal output from the LSI to be measured and acquire measurement data synchronously with the output data having jitter. The LSI test equipment includes a clock side time interpolator for acquiring the clock output from the LSI to be measured by a plurality of strobes having a predetermined timing interval and outputting it as encoded level data of time series, a data side time interpolator for acquiring the output data from the LSI to be measured by a plurality of strobes having a predetermined timing interval and outputting it as level data of time series, and a selector for receiving the level data from both of the time interpolators, selecting output data at the clock edge timing, and outputting it as data to be measured.
|
