发明名称 Method of forming an oxidation-resistant TiSiN film
摘要 A CVD process of forming a conductive film containing Ti, Si and N includes a first step of supplying gaseous sources of Ti, Si and N simultaneously to grow a conductive film and a second step of supplying the gaseous sources of Ti, Si and N in a state that a flow rate of the gaseous source of Ti is reduced, to grow the conductive film further, wherein the first step and the second step are conducted alternately.
申请公布号 US7105060(B2) 申请公布日期 2006.09.12
申请号 US20040917334 申请日期 2004.08.13
申请人 TOKYO ELECTRON LIMITED 发明人 SHIMOGAKI YUKIHIRO;KAWANO YUMIKO
分类号 C23C16/42;C23C16/455;C23C16/18;C23C16/30;C23C16/34;C23C16/52;H01L21/02;H01L21/28;H01L21/285;H01L21/8242;H01L21/8246;H01L27/105;H01L27/108 主分类号 C23C16/42
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