发明名称 Method for forming contact holes
摘要 A method of forming contact holes. A substrate on which a plurality of gate structures is formed is provided, wherein the gate structure comprises a gate, a gate capping layer, and a gate spacer. An insulating layer is formed on the gate structures and fills between the gate structures. The insulating layer is etched using the gate capping layers, the gate spacers, and the substrate as stop layers to form first contact holes between the gate structures to expose the substrate and the gate spacers and form second contact holes overlying each gate structure to expose the gate capping layers. A protective spacer is formed over each sidewall of the first contact holes and the second contact holes. The gate capping layer under each gate contact hole is etched using the protective spacer as a stop layer to expose the gate. The protective spacers are removed.
申请公布号 US7105453(B2) 申请公布日期 2006.09.12
申请号 US20040783467 申请日期 2004.02.20
申请人 NANYA TECHNOLOGY CORPORATION 发明人 CHEN YI-NAN;HUANG TSE-YAO;MAO HUI-MIN
分类号 H01L21/28;H01L21/302;H01L21/283;H01L21/3065;H01L21/461;H01L21/768;H01L21/8242;H01L27/108 主分类号 H01L21/28
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