发明名称 Method for peeling off semiconductor element and method for manufacturing semiconductor device
摘要 A method for peeling off a thin film semiconductor element over an insulating surface by using a void, and a method for manufacturing a semiconductor device by transferring the peeled semiconductor element. According to the peeling method of the invention, a first base layer having a plurality of recessed portions is formed over a substrate, and a second base layer having a plurality of voids is formed on the recessed portions of the first base layer. On the second base layer, a third base layer is formed and a semiconductor element is formed thereon. Then, by separating the second base layer at an intersecting surface with the voids, the semiconductor element is peeled off from the substrate.
申请公布号 US7105448(B2) 申请公布日期 2006.09.12
申请号 US20040787165 申请日期 2004.02.27
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 TAKAYAMA TORU;ARAI YASUYUKI
分类号 H01L21/302;H01L21/461;H01L21/68;H01L21/77;H01L21/84;H01L27/12;H01L29/786 主分类号 H01L21/302
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