发明名称 |
Temperature sensor and method for detecting trip temperature of a temperature sensor |
摘要 |
A comparator circuit of a temperature sensor includes an output node and a variable current node. The output node is a first voltage at a given temperature when a current at the variable current node is less than a threshold current, and a different second voltage at the given temperature when the current at the variable current node is more than the threshold current. A variable resistance circuit includes at least n resistors of different resistive values connected in series between the variable current node of the comparator and a supply voltage, where n is an integer of 4 or more. A switching circuit is provided to selectively bypasses individual ones of the n resistors during a test sequence to determine a trip temperature of the sensor.
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申请公布号 |
US7106127(B2) |
申请公布日期 |
2006.09.12 |
申请号 |
US20030627693 |
申请日期 |
2003.07.28 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
SIM JAE-YOON;YOO JEI-HWAN |
分类号 |
G01K7/22;H01L35/00;G01K3/00;G01K7/24;G11C11/401;G11C11/407;G11C29/00;G11C29/12;H03K17/94 |
主分类号 |
G01K7/22 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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