摘要 |
This device comprises a pulsed laser source ( 6 ), means ( 8, 10, 12 ) for focusing light from this source onto an object to be analysed ( 2 ) to produce plasma on the surface of the object, means ( 16, 18 ) of analyzing a plasma radiation spectrum, means ( 20 ) of determining the elementary composition of the object from this analysis, and possibly means ( 4 ) for displacing the object. The invention is particularly applicable to test radioactive materials.
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