发明名称 Elementary analysis device by optical emission spectrometry on laser produced plasma
摘要 This device comprises a pulsed laser source ( 6 ), means ( 8, 10, 12 ) for focusing light from this source onto an object to be analysed ( 2 ) to produce plasma on the surface of the object, means ( 16, 18 ) of analyzing a plasma radiation spectrum, means ( 20 ) of determining the elementary composition of the object from this analysis, and possibly means ( 4 ) for displacing the object. The invention is particularly applicable to test radioactive materials.
申请公布号 US7106439(B2) 申请公布日期 2006.09.12
申请号 US20040932829 申请日期 2004.09.01
申请人 COMMISSARIAT A L''ENERGIE ATOMIQUE 发明人 LACOUR JEAN-LUC;WAGNER JEAN-FRANCOIS;DETALLE VINCENT;MAUCHIEN PATRICK
分类号 G01J3/30;G01N21/63;G01N21/71 主分类号 G01J3/30
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