发明名称 High frequency scanning SQUID microscope and method of measuring high frequency magnetic fields
摘要 A scanning SQUID microscope capable of high frequency magnetic field measurements uses a hysteretic SQUID detector and a pulsed sampling technique which permits to extend the bandwidth of the SQUID microscope to above GHz region. The system can be readily incorporated into a 4.2k scanning SQUID microscope for imaging chips at room temperature. By biasing the hysteretic SQUID with pulses of a predetermined amplitude, and adjusting a modulation flux applied to the hysteretic SQUID at a plurality of time delays between the activation of the sample under study and the bias pulse, the hysteretic SQUID can be switched on, and the modulation flux value corresponding to such a switching event as a function of time is considered as representation of the magnetic field emanating from the sample under study.
申请公布号 US7106057(B2) 申请公布日期 2006.09.12
申请号 US20050081529 申请日期 2005.03.17
申请人 NATIONAL SECURITY AGENCY 发明人 MATTHEWS JOHN;WELLSTOOD FREDERICK CHARLES;KWON SOUN PIL;VLAHACOS KOSTA P.
分类号 G01R33/02;G01R33/035;G01R33/038 主分类号 G01R33/02
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