发明名称 Manufacturing method of semiconductor device
摘要 There is disclosed a method of manufacturing a semiconductor device, comprising forming an underlying region including an interlevel insulating film on a semiconductor substrate, forming an alumina film on the underlying region, forming a hole in the alumina film, filling the hole with a bottom electrode film, forming a dielectric film on the bottom electrode film, and forming a top electrode film on the dielectric film.
申请公布号 US7105400(B2) 申请公布日期 2006.09.12
申请号 US20030673262 申请日期 2003.09.30
申请人 INFINEON TECHNOLOGIES, AG 发明人 IMAI KEITARO;YAMAKAWA KOJI;ITOKAWA HIROSHI;NATORI KATSUAKI;ARISUMI OSAMU;NAKAZAWA KEISUKE;MOON BUM-KI
分类号 H01L21/8234;H01L21/00;H01L21/336;H01L21/8244;H01L21/8246;H01L27/115 主分类号 H01L21/8234
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