发明名称 Line width check in layout database
摘要 A machine-readable medium has a set of machine-readable instructions for causing a computer to perform a method. The method includes checking a layout having a layout line width for at least one line versus a schematic having a schematic line width for the at least one line. Extracting a line width property from the schematic and transferring the line width property to the layout are included in the method, as is checking a design for the at least one line versus the schematic.
申请公布号 US7107554(B2) 申请公布日期 2006.09.12
申请号 US20040782252 申请日期 2004.02.19
申请人 MICRON TECHNOLOGY, INC. 发明人 CHEVALLIER CHRISTOPHE;ABABEI ADRIANA
分类号 G06F17/50 主分类号 G06F17/50
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