发明名称 Dual level out-of-focus light source for amplification of defects on a surface
摘要 A web defect inspection system includes line scan cameras positioned across the width of a web and a dual-level out-of-focus light source for illuminating the web. An illumination surface of the dual-level light source has a bright portion adjacent a dark portion. One such dual-level light source is provided by covering a portion of a diffused light surface with an opaque material having a sharp edge. The pixels of each line scan camera are aligned with the dark to light transition of the light source so that each pixel has a no-defect brightness level equal to half of a relative brightness level of the bright portion of the dual-level light source. An image of a defect-free portion of the web consists of pixels having relative brightness levels within a pre-determined range of the no-defect brightness level. Images of defects on the web surface appear three-dimensional as bright and dark areas. The nature of the defect, that is, whether the defect is concave or convex, is determined based upon the orientation of the dual-level light source and the direction of movement of the web.
申请公布号 US7105848(B2) 申请公布日期 2006.09.12
申请号 US20030413699 申请日期 2003.04.15
申请人 WINTRISS ENGINEERING CORPORATION 发明人 GUHA SUJOY;LASSITER TERRELL NILS
分类号 G01N21/88;G01N21/86;G01N21/89;G01V8/00 主分类号 G01N21/88
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