| 摘要 |
PROBLEM TO BE SOLVED: To provide a solid-state imaging element wherein the position of its faulty pixel part can be identified easily by visual observation. SOLUTION: The solid-state imaging element is constituted out of a number of pixel parts including a photodiode 30, an opening 5 formed thereabove, an intralayer lens 8, a color filter, and a micro-lens 11, etc. A portion of the number of pixel parts is used as a marking pixel part to become the mark of a base point for identifying by visual observation the position of a faulty pixel part included in the number of pixel parts, whereat the faulty pixel part is located on the solid-state imaging element. By this constitution, the position of the faulty pixel part can be so identified easily by using the marking pixel part as the base point as to be able to perform efficiently the faultiness analysis of the solid-state imaging element. COPYRIGHT: (C)2006,JPO&NCIPI
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