发明名称 NONVOLATILE MEMORY ELEMENT AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a nonvolatile memory element preparing a gate structure formed on a semiconductor substrate. SOLUTION: The gate structure comprises: a first insulating film 220 on the semiconductor substrate; a storage node 230, formed on the first insulating film, for holding potential; a second insulating film 240 on the storage node; a third insulating film 250 on the second insulating film; and a control gate electrode 260 on the third insulating film. And, at least one dielectric constant of the second insulating film and the third insulating film is greater than that of the first insulating film. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006237604(A) 申请公布日期 2006.09.07
申请号 JP20060043014 申请日期 2006.02.20
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 HAN JEONG-HEE;KIM JU-HYUNG;KIM CHUNG-WOO;JEON SANG-HUN;JEONG YOUN-SEOK;LEE SEUNG-HYUN
分类号 H01L21/8247;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/8247
代理机构 代理人
主权项
地址
您可能感兴趣的专利