发明名称 VOLTAGE COMPARISON DEVICE, AND OVERCURRENT SENSING CIRCUIT AND SEMICONDUCTOR DEVICE USING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a voltage comparison device wherein a threshold voltage can be inspected simply. SOLUTION: A reference voltage source 12 generates a predetermined reference voltage Vref. The reference voltage Vref is applied to a noninverting input terminal of a processing amplifier 10. Resistors R1, R2 are connected in series to a part between an input terminal 102 and ground potential. A connection point of the resistors R1, R2 is connected to an inverse input terminal of the processing amplifier 10. To the inverse input terminal of the processing amplifier 10, a voltage Vx is applied in which an inspection voltage Vin has been divided by the resistors R1, R2. A switch SW1 is arranged between an output terminal 104 and the input terminal 102. A switch controller 14 turns on the SW1 in a verification mode which inspects a threshold voltage Vth of a voltage comparison device 100 and turns off the SW1 in a normal mode which compares the inspection voltage Vin with the threshold voltage Vth. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006238331(A) 申请公布日期 2006.09.07
申请号 JP20050053384 申请日期 2005.02.28
申请人 ROHM CO LTD 发明人 EZAKI TAKESHI;SENDA TAISUKE
分类号 H03K5/08 主分类号 H03K5/08
代理机构 代理人
主权项
地址