发明名称 OVERTEMPERATURE DETECTING CIRCUIT AND OVERTEMPERATURE PROTECTION CIRCUIT
摘要 PROBLEM TO BE SOLVED: To provide an overtemperature detecting circuit and an overtemperature protection circuit capable of preventing a chip from being damaged due to overtemperature by properly detecting overtemperature at the center of the chip. SOLUTION: The overtemperature detecting circuit 10 comprises a diode 11 for detecting the temperature of the semiconductor chip 23; and a threshold set circuit for setting a determination temperature threshold value of the overtemperature requiring the measure for protection of the semiconductor chip 23 in response to the change rate of the chip temperature revealed by the diode 11 by detecting the change rate. The temperature detected by the diode 11 and the determination temperature threshold value set by the threshold value set circuit are compared with each other. When the temperature detected by the diode 11 is above the determination temperature threshold value set by the threshold value set circuit, the temperature of the semiconductor chip 23 is detected to be overtemperature. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006237331(A) 申请公布日期 2006.09.07
申请号 JP20050050633 申请日期 2005.02.25
申请人 NISSAN MOTOR CO LTD 发明人 SATO YOSHINORI
分类号 H01L27/04;G01K7/01;H01L21/822;H01L29/739;H01L29/78 主分类号 H01L27/04
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