发明名称 Temperature detecting circuit
摘要 A high precision temperature detecting circuit is disclosed. The temperature detecting circuit includes a first voltage source circuit for generating a voltage VPN that has a negative temperature coefficient using a work function difference of gate electrodes of two field effect transistors, a second voltage source circuit for generating a reference voltage VREF 1 that is independent of temperature change using a work function difference of gate electrodes of two or more field effect transistors, an impedance conversion circuit for converting impedance of the voltage VPN and the reference voltage VREF 1 , and a subtracter circuit, to which the impedance converted voltages VPN and VREF 1 are provided, for obtaining a difference voltage between the voltage VPN and the reference voltage VREF 1 , and for amplifying the difference voltage.
申请公布号 US2006197581(A1) 申请公布日期 2006.09.07
申请号 US20060370273 申请日期 2006.03.06
申请人 CHUN YONG-JIN;WATANABE HIROFUMI 发明人 CHUN YONG-JIN;WATANABE HIROFUMI
分类号 H01L35/00 主分类号 H01L35/00
代理机构 代理人
主权项
地址