发明名称 SELF-CALIBRATING TEMPERATURE PROBE
摘要 PROBLEM TO BE SOLVED: To provide a calibration device for a probe for accurately measuring the temperature of a substrate in a substrate treatment chamber. SOLUTION: This probe 40 includes a light guide body 42, one end of which is inserted in a processing chamber. The other end of the light guide body is coupled to a bifurcated optical fiber 46. A light source 54 is optically coupled to one branch of the optical fiber, and a pyrometer 56 is optically coupled to another branch. In order to self-calibrate the probe, an object 80 of stable reflectivity, e.g. a gold-plated wafer, is inserted into the chamber, the light source is activated, and the intensity of light reflected from the object is measured by the pyrometer. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006234828(A) 申请公布日期 2006.09.07
申请号 JP20060101998 申请日期 2006.04.03
申请人 APPLIED MATERIALS INC 发明人 YAM MARK
分类号 G01D3/00;G01J5/00;G01B11/30;G01J5/04;G01J5/08;G01J5/10;G01J5/52;G01J5/54;G01J5/58 主分类号 G01D3/00
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