发明名称 POLISHING DEVICE AND METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide polishing device and method for mitigating a drying environment around a wafer carrier. <P>SOLUTION: This polishing device polishes a wafer held by the wafer carrier by making the wafer abut on a rotating polishing pad, while supplying slurry. The polishing device is provided with a humidifying means 70 for controlling the internal humidity to a prescribed value. The polishing is performed, while maintaining the inside of the polishing device at the prescribed humidity. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006231419(A) 申请公布日期 2006.09.07
申请号 JP20050045065 申请日期 2005.02.22
申请人 TOKYO SEIMITSU CO LTD 发明人 KINOSHITA OSAMU
分类号 B24B37/015;B24B37/04;B24B37/30;B24B55/06;H01L21/304 主分类号 B24B37/015
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