| 摘要 |
PROBLEM TO BE SOLVED: To provide a method for analyzing and modeling a failure cause and its influence in a SAN. SOLUTION: This method includes a step for selecting one component from a plurality of components for expressing a relationship between components related to the SAN, a step for performing mapping processing between a plurality of events occurring between the components and a plurality of visible observation events, and a step for carrying out system analysis based on the mapping processing. The mapping processing is displayed as a value relating the respective event to the respective visible observed events. The analysis method and the analysis device for the SAN included in a large-scale system serving as a plurality of logic domains includes a step for selecting one component from a plurality of components for expressing a relationship between the components, a step for performing mapping processing between a plurality of events occurring between the components and a plurality of visible observation events, and a step for carrying out system analysis based on the mapping processing. COPYRIGHT: (C)2006,JPO&NCIPI
|
