发明名称 Tester simulation system and tester simulation method using same
摘要 It is an object of the invention to implement a tester simulation system capable of finding margins of respective expected value determining timings in a short time, and a tester simulation method using the same. The invention is an improvement of a tester simulation system for executing a test of a device under test by use of a tester by running a simulation using a DUT model for simulating an operation of the device under test, and a tester model for simulating an operation of the tester. The tester simulation system is characterized in comprising a margin analyzing means for analyzing margins of respective expected value determining timings on the basis of output data of the DUT model.
申请公布号 US2006200721(A1) 申请公布日期 2006.09.07
申请号 US20060331016 申请日期 2006.01.13
申请人 YOKOGAWA ELECTRIC CORPORATION 发明人 KOBAYASHI FUMIHIKO
分类号 G01R31/28;G06F11/00 主分类号 G01R31/28
代理机构 代理人
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