摘要 |
It is an object of the invention to implement a tester simulation system capable of finding margins of respective expected value determining timings in a short time, and a tester simulation method using the same. The invention is an improvement of a tester simulation system for executing a test of a device under test by use of a tester by running a simulation using a DUT model for simulating an operation of the device under test, and a tester model for simulating an operation of the tester. The tester simulation system is characterized in comprising a margin analyzing means for analyzing margins of respective expected value determining timings on the basis of output data of the DUT model.
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