发明名称 Manufacturing Method of Semiconductor Device
摘要 The present invention has an object to perform a peeling treatment in a short time. Peeling is performed while a peeling layer is exposed to an atmosphere of an etching gas. Alternatively, peeling is performed while an etching gas for a peeling layer is blown to the peeling layer in an atmosphere of an etching gas. Specifically, an etching gas is blown to a part to be peeled while a layer to be peeled is torn off from a substrate. Alternatively, peeling is performed in an etchant for a peeling layer while supplying an etchant to the peeling layer.
申请公布号 US2006199382(A1) 申请公布日期 2006.09.07
申请号 US20060276349 申请日期 2006.02.24
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 SUGIYAMA EIJI;DOZEN YOSHITAKA;FUKUMOTO YUMIKO;KUWABARA HIDEAKI;YAMAZAKI SHUNPEI
分类号 H01L21/44;H01L21/461 主分类号 H01L21/44
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