发明名称 |
FABRICATION PROCESS OF SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a process for fabricating a semiconductor device in which a semiconductor substrate is not subjected to considerable damage. SOLUTION: The process for fabricating a semiconductor device comprises steps of: isolating an element region from other region by forming an element isolation film 2 on a semiconductor substrate 1; forming a gate insulation film 3 on the semiconductor substrate 1 located in the element region; forming a first polysilicon film 41 introduced with impurities on the element isolation film 2 and the gate insulation film 3; forming a second polysilicon film 42 on the first polysilicon film 41; and forming a gate electrode 4 on the gate insulation film 3 by patterning the first polysilicon film 41 and the second polysilicon film 42. COPYRIGHT: (C)2006,JPO&NCIPI
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申请公布号 |
JP2006237040(A) |
申请公布日期 |
2006.09.07 |
申请号 |
JP20050045146 |
申请日期 |
2005.02.22 |
申请人 |
SEIKO EPSON CORP |
发明人 |
EUCHI SHOICHI;TAKAHASHI HIROTSUGU |
分类号 |
H01L29/78;H01L21/28;H01L21/8238;H01L27/092;H01L29/423;H01L29/49 |
主分类号 |
H01L29/78 |
代理机构 |
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地址 |
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