| 摘要 |
<p>The present invention provides an RFID label inspection apparatus with which improvements in yield percentage, manufacturing efficiency, and operating efficiency can be achieved. An RFID label inspection apparatus 100-1 determines the quality of an RFID label 210 according to the communication condition between an RFID tag 204 encased in the RFID label 210 and an antenna 104, and when the RFID label 210 is determined to be defective, a peeling roller 108 is rotated to peel the defective RFID label 210 away from a backing sheet 202. The RFID label inspection apparatus 100-1 also conveys a replacement RFID label 216 by rotating rollers 114, 118a, 118b and a wind-up shaft 119, and the replacement RFID label 216 is temporarily adhered to the backing sheet 202, by a roller 120, in the former temporary adhesion position of the RFID label 210 that has been peeled away.</p> |
