发明名称 Surface texture measuring probe and microscope utilizing the same
摘要 <p>A surface texture measuring probe (60) includes a probe head (65), a first supporting body (61), a second supporting body (62), a piezoelectric element (63) and a balancer (64). The first supporting body includes a first supporter (611) having an inner space, and a plurality of beams (613) respectively extending from equiangular arrangement positions of the first supporter toward the center and supporting the probe head (65) at the tip end thereof. The second supporting body (62) includes a second supporter (621) and a holder (622) supported by a plurality of beams (623) respectively extending from equiangular arrangement positions of the second supporter towards the center. The piezoelectric element (63) is disposed between the probe head and the holder, and formed to vibrate in an axial direction.</p>
申请公布号 EP1653478(A3) 申请公布日期 2006.09.06
申请号 EP20050023874 申请日期 2005.11.02
申请人 MITUTOYO CORPORATION 发明人 HIDAKA, KAZUHIKO
分类号 G01Q10/04;G01Q60/16;G01Q60/18;G01Q60/22;G01Q60/38;G01Q70/04;G01Q70/10 主分类号 G01Q10/04
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