发明名称
摘要 A method of forming a mask pattern includes a step of laminating a first resist layer on a base layer, a step of exposing the first resist layer using a first pattern with a pattern of at least one via hole, a step of developing the first resist layer exposed to remove a part of the first resist layer, the part corresponding to an area of the at least one via hole, a step of laminating a second resist layer on the first resist layer and on the base layer in the area of the at least one via hole, a step of exposing the second resist layer using a second pattern, and a step of developing the second resist layer exposed and the first resist layer to remove a part of the second resist layer and all of the first resist layer so as to form the mask pattern made of the second resist layer.
申请公布号 JP3818188(B2) 申请公布日期 2006.09.06
申请号 JP20020081180 申请日期 2002.03.22
申请人 发明人
分类号 G03F7/40;H01L21/027;G03F7/00;G03F7/20;G11B5/31 主分类号 G03F7/40
代理机构 代理人
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