DELAY CIRCUIT AND TESTING APPARATUS

摘要

A delay circuit for delaying an input signal according to a desired delay time setting and outputting the same is provided. The delay circuit includes: a delay element for delaying the input signal for a delay time based on a given supply current and outputting the same; a current supply section for generating a supply current; a voltage generating section for generating a base voltage dependent on a delay time setting; and a control section for converting a base voltage to a control voltage dependent on the characteristic of the current supply section and providing the same to the current supply section in order to cause the current supply section to generate the supply current. The current supply section may have a predetermined conductivity and include a first MOS transistor for applying a drain current to the delay element as the supply current. The control section may generate a first control voltage to operate a first MOS transistor in a saturation region and provide the same to a gate terminal of the first MOS transistor.