| 摘要 |
AN IC TESTING APPARATUS PROVIDED WITH A FIRST SUCTION HEAD 304C FOR TRANSFERRING SEMICONDUCTOR DEVICES CONVEYED TO A FIRST POSITION CR5 IN A TEST PORTION TO A CONTACT SECTION 302A OF A TEST HEAD 302 FOR A TEST, THEN EJECTING THE SEMICONDUCTOR DEVICES FROM THE CONTACT SECTION 302A AND A SECOND SUCTION HEAD 304C FOR TRANSFERRING SEMICONDUCTOR DEVICES COVEYED TO A SECOND POSITION CR5 IN THE TEST PORTION TO THE CONTACT SECTION 302A, THEN EJECTING THE SEMICONDUCTORDEVICES FROM THE CONTACT SECTION 302A.(FIG.2) |
