发明名称 INTEGRATED CIRCUIT MEMORY HAVING A FUSE DETECT CIRCUIT AND METHOD THEREFOR
摘要 <p>Fuses and detect circuits (124) in an integrated circuit memory (100)include a copper fuse (208) and a fuse state detect stage (202) for detecting the open circuit state or the closed circuit state of the fuse (208). The fuse detect circuit (124) provides an output signal corresponding to the state of the fuse and during detecting, limits a voltage drop across the fuse to an absolute value independent of a power supply voltage applied to the integrated circuit memory. The fuse detect circuit (124) operates at power up of the integrated circuit memory (100) and is disabled after the state of the fuse is detected and latched, and the power supply is sufficient for reliable operation of the integrated circuit memory (100). By limiting the voltage drop across a blown copper fuse (208), a potential electro-migration problem is reduced.</p>
申请公布号 SG124223(A1) 申请公布日期 2006.08.30
申请号 SG20000007906 申请日期 2000.02.11
申请人 FREESCALE SEMICONDUCTOR, INC. 发明人 STARNES, GLENN E.;FLANNAGAN, STEPHEN T.;CHANG, RAY
分类号 H01L21/82;G06F11/00;G11C29/02;G11C29/04;G11C29/44 主分类号 H01L21/82
代理机构 代理人
主权项
地址