发明名称 |
METHOD FOR REPAIRING ERRORS OF PATTERNS EMBODIED IN THIN LAYERS |
摘要 |
The correction of an erroneous design realised in a first thin layer comprising a first engraved sub-layer (120) with the erroneous design and at least one second sub-layer (110) situated between a substrate (100) and the first sub-layer, consists of: (A) deposition of a second thin layer (300) on the first thin layer; (B) the direct engraving in the second thin layer of the desired correction; (C) engraving the second sub-layer across the first sub-layer. |
申请公布号 |
EP1695145(A2) |
申请公布日期 |
2006.08.30 |
申请号 |
EP20040816552 |
申请日期 |
2004.12.15 |
申请人 |
COMMISSARIAT A L'ENERGIE ATOMIQUE |
发明人 |
PAIN, LAURENT |
分类号 |
G03F1/68;G03F1/00;H01L21/311;H01L21/3213 |
主分类号 |
G03F1/68 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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