发明名称 METHOD FOR REPAIRING ERRORS OF PATTERNS EMBODIED IN THIN LAYERS
摘要 The correction of an erroneous design realised in a first thin layer comprising a first engraved sub-layer (120) with the erroneous design and at least one second sub-layer (110) situated between a substrate (100) and the first sub-layer, consists of: (A) deposition of a second thin layer (300) on the first thin layer; (B) the direct engraving in the second thin layer of the desired correction; (C) engraving the second sub-layer across the first sub-layer.
申请公布号 EP1695145(A2) 申请公布日期 2006.08.30
申请号 EP20040816552 申请日期 2004.12.15
申请人 COMMISSARIAT A L'ENERGIE ATOMIQUE 发明人 PAIN, LAURENT
分类号 G03F1/68;G03F1/00;H01L21/311;H01L21/3213 主分类号 G03F1/68
代理机构 代理人
主权项
地址