摘要 |
A conductor is disposed within an area where electric coupling and magnetic coupling take place between the conductor and a device-under-test (DUT) in at least a portion of frequency band width, and the value of composite currents that is outputted in a plurality of directions different from each other against the DUT, is measured. Based on the measured plurality of values of the composite currents, the first electric current due to electric coupling between the DUT and the conductor and the second electric current due to magnetic coupling between the DUT and the conductor are calculated. From these first and second electric current values, electric field intensity and magnetic field intensity are calculated.
|