发明名称 Controlling the timing of test modes in a multiple processor system
摘要 A system includes a first processor, a second processor and a circuit. The first processor includes a first terminal and enters a first test mode in response to the first terminal having a first signal state. The second processor includes a second terminal. The second processor enters a second test mode in response to the second terminal having a second signal state. The circuit may regulate the timing of the first and second signal states to place both the first processor in the first test mode and the second processor in the second test mode at approximately the same time. The circuit may regulate the timing of the signals to cause the first and second processors to resume normal modes of operation at approximately the same time.
申请公布号 US7100033(B2) 申请公布日期 2006.08.29
申请号 US20020278400 申请日期 2002.10.23
申请人 INTEL CORPORATION 发明人 ROTH CHARLES P.;DESAI MINESH S.;MUELLER GEROLD;LACHNER PETER
分类号 G06F11/30;G06F11/22;G06F19/00 主分类号 G06F11/30
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