发明名称 Methods and apparatus for controlled-angle wafer positioning
摘要 The orientation of a wafer with respect to the surface of an electrolyte is controlled during an electroplating process. The wafer is delivered to an electrolyte bath along a trajectory normal to the surface of the electrolyte. Along this trajectory, the wafer is angled before entry into the electrolyte for angled immersion. A wafer can be plated in an angled orientation or not, depending on what is optimal for a given situation. Also, in some designs, the wafer's orientation can be adjusted actively during immersion or during electroplating, providing flexibility in various electroplating scenarios.
申请公布号 US7097410(B1) 申请公布日期 2006.08.29
申请号 US20030379858 申请日期 2003.03.04
申请人 NOVELLUS SYSTEMS, INC. 发明人 REID JONATHAN D.;MAYER STEVEN T.;VARADARAJAN SESHASAYEE;SMITH DAVID C.;PATTON EVAN E.;KALAKKAD DINESH S.;LIND GARY;HILL RICHARD S.
分类号 B65G47/90;C25D5/00;C25D7/12;H01L21/288 主分类号 B65G47/90
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