发明名称 |
X-ray inspection apparatus and X-ray inspection method |
摘要 |
The X-ray inspection device and the X-ray inspection method according to the present invention are configured to hold an object to be inspected irradiated with an X-ray from an X-ray irradiation device, uses a swinging device for performing swinging motion of tilting the object to be inspected at an arbitrary angle and in an arbitrary direction, images the X-ray that passes through the object to be inspected in an X-ray detection device and extracts data of a desired cross section from the X-ray image of the X-ray detection device in a control device.
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申请公布号 |
US7099432(B2) |
申请公布日期 |
2006.08.29 |
申请号 |
US20040924363 |
申请日期 |
2004.08.23 |
申请人 |
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. |
发明人 |
ICHIHARA MASARU;YOSHINO SHINJI;INOUE HIROYUKI;KINOSHITA TOSHIO;OHUCHI KAZUO |
分类号 |
G01N23/083;G01B15/06;G01N23/02;G01N23/04;H05G1/02;H05G1/08;H05G1/26 |
主分类号 |
G01N23/083 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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