发明名称 X-ray inspection apparatus and X-ray inspection method
摘要 The X-ray inspection device and the X-ray inspection method according to the present invention are configured to hold an object to be inspected irradiated with an X-ray from an X-ray irradiation device, uses a swinging device for performing swinging motion of tilting the object to be inspected at an arbitrary angle and in an arbitrary direction, images the X-ray that passes through the object to be inspected in an X-ray detection device and extracts data of a desired cross section from the X-ray image of the X-ray detection device in a control device.
申请公布号 US7099432(B2) 申请公布日期 2006.08.29
申请号 US20040924363 申请日期 2004.08.23
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 ICHIHARA MASARU;YOSHINO SHINJI;INOUE HIROYUKI;KINOSHITA TOSHIO;OHUCHI KAZUO
分类号 G01N23/083;G01B15/06;G01N23/02;G01N23/04;H05G1/02;H05G1/08;H05G1/26 主分类号 G01N23/083
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