发明名称 METHOD FOR PRODUCING MICROMECHANICAL ELEMENTS CAN BE INTEGRATED INTO CMOS TECHNOLOGY, CARRYING MONOLITH SI AND MONOLITH SIO PRODUCED BY POROUS SI MICROMANUFACTURING PROCESS
摘要 A process for fabricating a monocrystalline silicon micromechanical element integrated with a CMOS circuit element within the CMOS technology, wherein a domain of second conducting property is formed within a substrate of first conducting property; the second conducting property is reverse with respect to the first conducting property. A domain of monocrystalline Si is formed within the substrate for fabricating a micromechanical element. A CMOS circuit element as well as a portion of the domain are covered with a protecting layer. Front-side isotropic porous Si-etching from the exposed surface of the domain continues until the portion that will carry the micromechanical element becomes underetched. A porous Si sacrificial layer is created which at least partially encloses the portion. Then the exposed surface of the porous Si sacrificial layer is passivated by applying a metallic thin film thereon. Finally, the metallic thin film that covers the exposed surface of the porous Si sacrificial layer is removed and the porous Si sacrificial layer is dissolved thereby forming the micromechanical element.
申请公布号 HU0600488(D0) 申请公布日期 2006.08.28
申请号 HU20060000488 申请日期 2006.06.13
申请人 MTA MUESZAKI FIZIKAI ES ANYAGTUDOMANYI KUTATOINTEZET 发明人
分类号 G06F3/041 主分类号 G06F3/041
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