| 摘要 |
FIELD: testing semiconductor devices. ^ SUBSTANCE: proposed device that can be used for investigating and developing Gunn diodes has regulating components, as well as input and output terminals. Output terminals are connected in parallel with instrument resistor. Switch-mode power supply is connected to primary winding of transformer whose secondary winding is connected to input of low-pass filter. Output of the latter is connected to series circuit set up of Gunn diode and instrument resistor. ^ EFFECT: ability of precluding interaction between diode under test and measuring circuit. ^ 1 cl, 2 dwg |
