发明名称 |
APPARATUS AND METHOD FOR SUPPORTING RADIO FREQUENCY(RF) AND DIRECT CURRENT(DC) TEST IN RF DEVICE |
摘要 |
<p>Provided are example embodiments of a test supporting device including a radio frequency (RF) line adapted to transmit an RF signal from an RF terminal to test equipment, a direct current (DC) line connected to the RF line at a first end and adapted to connect to the test equipment at a second end, and a capacitor connected to the DC line at a first end and connected to ground at a second end. Example embodiments of the present invention may also provide a test method including measuring a radio frequency (RF) signal, and measuring a direct current (DC) signal passed through an open stub.</p> |
申请公布号 |
KR100618899(B1) |
申请公布日期 |
2006.08.25 |
申请号 |
KR20050048822 |
申请日期 |
2005.06.08 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
PARK, IL CHAN;KIM, YOUNG BU;NAM, SEUNG KI |
分类号 |
G01R31/00 |
主分类号 |
G01R31/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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