发明名称 APPARATUS AND METHOD FOR SUPPORTING RADIO FREQUENCY(RF) AND DIRECT CURRENT(DC) TEST IN RF DEVICE
摘要 <p>Provided are example embodiments of a test supporting device including a radio frequency (RF) line adapted to transmit an RF signal from an RF terminal to test equipment, a direct current (DC) line connected to the RF line at a first end and adapted to connect to the test equipment at a second end, and a capacitor connected to the DC line at a first end and connected to ground at a second end. Example embodiments of the present invention may also provide a test method including measuring a radio frequency (RF) signal, and measuring a direct current (DC) signal passed through an open stub.</p>
申请公布号 KR100618899(B1) 申请公布日期 2006.08.25
申请号 KR20050048822 申请日期 2005.06.08
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, IL CHAN;KIM, YOUNG BU;NAM, SEUNG KI
分类号 G01R31/00 主分类号 G01R31/00
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