发明名称 |
DEVICE AND METHOD FOR EVALUATING WAVEFORM MEASURING DEVICE AND METHOD FOR MEASURING JITTER |
摘要 |
<p>Jitter of a signal generator is measured more accurately by subtracting temporal fluctuation of a waveform measuring instrument used for measuring jitter from jitter measured by a jitter measuring instrument. The fluctuation of a waveform measuring device is evaluated by an evaluating device comprising a passive circuit (101) having a capacity (112), a drive circuit (102) for charging/discharging the capacity, and a signal processing means (105) for determining temporal fluctuation of the waveform measuring device by performing signal processing on a response waveform being obtained from the waveform measuring device (103) and indicative of temporal variation of output signal from the passive circuit, the signal processing means comprising a processing means (105a) for determining variation in measurements of output signal from the passive circuit by the waveform measuring device based on a plurality of response waveforms of the passive circuit measured by the waveform measuring device when the capacity is charged or discharged under the same conditions, and a means (105b) for converting the variation in measurements by the waveform measuring device obtained from the processing means into a temporal fluctuation.</p> |
申请公布号 |
WO2006087782(A1) |
申请公布日期 |
2006.08.24 |
申请号 |
WO2005JP02428 |
申请日期 |
2005.02.17 |
申请人 |
KYOCERA KINSEKI CORPORATION;KAWASHIMA, MAKOTO;KATO, MANABU;DOI, ARATA |
发明人 |
KAWASHIMA, MAKOTO;KATO, MANABU;DOI, ARATA |
分类号 |
G01R29/02;G01R13/20;G01R35/00 |
主分类号 |
G01R29/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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