发明名称 DEVICE AND METHOD FOR EVALUATING WAVEFORM MEASURING DEVICE AND METHOD FOR MEASURING JITTER
摘要 <p>Jitter of a signal generator is measured more accurately by subtracting temporal fluctuation of a waveform measuring instrument used for measuring jitter from jitter measured by a jitter measuring instrument. The fluctuation of a waveform measuring device is evaluated by an evaluating device comprising a passive circuit (101) having a capacity (112), a drive circuit (102) for charging/discharging the capacity, and a signal processing means (105) for determining temporal fluctuation of the waveform measuring device by performing signal processing on a response waveform being obtained from the waveform measuring device (103) and indicative of temporal variation of output signal from the passive circuit, the signal processing means comprising a processing means (105a) for determining variation in measurements of output signal from the passive circuit by the waveform measuring device based on a plurality of response waveforms of the passive circuit measured by the waveform measuring device when the capacity is charged or discharged under the same conditions, and a means (105b) for converting the variation in measurements by the waveform measuring device obtained from the processing means into a temporal fluctuation.</p>
申请公布号 WO2006087782(A1) 申请公布日期 2006.08.24
申请号 WO2005JP02428 申请日期 2005.02.17
申请人 KYOCERA KINSEKI CORPORATION;KAWASHIMA, MAKOTO;KATO, MANABU;DOI, ARATA 发明人 KAWASHIMA, MAKOTO;KATO, MANABU;DOI, ARATA
分类号 G01R29/02;G01R13/20;G01R35/00 主分类号 G01R29/02
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