摘要 |
PROBLEM TO BE SOLVED: To provide a device and method for inspecting printed circuit boards that can easily find defects, by surely inspecting the conduction of a through hole of a multilayer printed circuit board, the conduction of various patterns and short circuiting. SOLUTION: The device for inspecting the defect comprises moving probe electrodes 4-1 and 4-2, having a plurality of electrodes 41 and 42, juxtaposed to form a row along an inspection object printed circuit board so as to be in contact with measuring points, corresponding to the inspection object printed circuit board 1, moving pad-like planar electrodes 5-1 and 5-2 along the inspection object printed circuit board, while being in contact with the measuring points of the inspection object printed circuit board, and maintaining contact with the measuring points and following the movement of the probe electrodes 41 and 42, and determining the defects between the measuring points, by measuring the electrical continuity between the measuring points of the inspection object printed circuit board, in contact with each of the electrode pin 41 and 42 and the measuring points of the measured printed circuit board, in contact with the pad-like planar electrodes 5-1 and 5-2. COPYRIGHT: (C)2006,JPO&NCIPI
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