发明名称 Capacitor of semiconductor device and method of fabricating the same
摘要 Provided is a capacitor of a semiconductor device and a method of fabricating the same. In one embodiment, the capacitor includes a lower electrode formed on a semiconductor substrate; a dielectric layer formed on the lower electrode; and an upper electrode that is formed on the dielectric layer. The upper electrode includes a first conductive layer, a second conductive layer, and a third conductive layer stacked sequentially. The first conductive layer comprises a metal layer, a conductive metal oxide layer, a conductive metal nitride layer, or a conductive metal oxynitride layer. The second conductive layer comprises a doped polysilicon germanium layer. The third conductive layer comprises a material having a lower resistance than that of the second conductive layer.
申请公布号 US2006186452(A1) 申请公布日期 2006.08.24
申请号 US20050316487 申请日期 2005.12.21
申请人 NAM GAB-JIN;KIM YOUNG-SUN;YOO CHA-YOUNG;LEE JONG-CHEOL;NOH JIN-TAE;AHN JAE-YOUNG;PARK YOUNG-GEUN;CHOI JAE-HYOUNG;YEO JAE-HYUN 发明人 NAM GAB-JIN;KIM YOUNG-SUN;YOO CHA-YOUNG;LEE JONG-CHEOL;NOH JIN-TAE;AHN JAE-YOUNG;PARK YOUNG-GEUN;CHOI JAE-HYOUNG;YEO JAE-HYUN
分类号 H01L27/108;H01L29/76;H01L29/94;H01L31/119 主分类号 H01L27/108
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