METHOD FOR TESTING SEMICONDUCTOR INTEGRATED CIRCUIT

摘要

PROBLEM TO BE SOLVED: To provide a method for testing the detection voltage level kept by the voltage detection circuit of the semiconductor voltage detection circuit with a small number of DC measurement units for the semiconductor integrated circuit with a built-in voltage detection function. SOLUTION: The detection voltage is measured by acquiring the change of current of DC measurement unit by utilizing the large change of flowing current in the semiconductor integrated circuit 6 by inverting the voltage level of OUT terminal at the before and after the voltage detection, the circuit current of the semiconductor integrated circuit 6 is measured while sweeping the applied voltage using one DC measurement unit provided with voltage applied current measurement function. COPYRIGHT: (C)2006,JPO&NCIPI