发明名称 Semiconductor device and method of manufacturing the same
摘要 A first gas including a silicon-containing compound is introduced into a vacuum chamber, to expose a semiconductor substrate placed in the chamber to the first gas atmosphere (silicon processing step). Then the pressure inside the vacuum chamber is reduced to a level lower than the pressure at the time of starting the silicon processing step (depressurizing step). Thereafter, a second gas including a nitrogen-containing compound is introduced into the vacuum chamber, and the semiconductor substrate is irradiated with the second gas plasma (nitrogen plasma step).
申请公布号 US2006186549(A1) 申请公布日期 2006.08.24
申请号 US20060355003 申请日期 2006.02.16
申请人 NEC ELECTRONICS CORPORATION 发明人 USAMI TATSUYA;OHTO KOICHI;TAKEWAKI TOSHIYUKI
分类号 H01L23/48;H01L21/44 主分类号 H01L23/48
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