发明名称 Multiple layer etch stop and etching method
摘要 A process for etching semiconductor substrates using a deep reactive ion etching process to produce through holes or slots (hereinafter "slots") in the substrates. The process includes applying a first layer to a back side of a substrate as a first etch stop material. The first layer is a relatively soft etch stop material. A second layer is applied to the first layer on the back side of the substrate to provide a composite etch stop layer. The second layer is a relatively hard etch stop material. The substrate is etched from a side opposite the back side of the substrate to provide a slot in the substrate.
申请公布号 US2006189144(A1) 申请公布日期 2006.08.24
申请号 US20050063108 申请日期 2005.02.22
申请人 KRAWCZYK JOHN W;MCNEES ANDREW L;MONEY CHRISTOPHER J;PATIL GIRISH S;RHINE DAVID B;VAIDEESWARAN KARTHIK 发明人 KRAWCZYK JOHN W.;MCNEES ANDREW L.;MONEY CHRISTOPHER J.;PATIL GIRISH S.;RHINE DAVID B.;VAIDEESWARAN KARTHIK
分类号 H01L21/30 主分类号 H01L21/30
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