发明名称 High reliability etched-facet photonic devices
摘要 Semiconductor photonic device surfaces are covered with a dielectric or a metal protective layer. The protective layer covers the entire device, including regions near facets at active regions, to prevent bare or unprotected semiconductor regions, thereby to form a very high reliability etched facet photonic device.
申请公布号 US2006187985(A1) 申请公布日期 2006.08.24
申请号 US20060356203 申请日期 2006.02.17
申请人 BINOPTICS CORPORATION 发明人 BEHFAR ALEX A.
分类号 H01S5/00;H01S3/04 主分类号 H01S5/00
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