| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a test writing method for writing information by forming marks different from the unwritten area by applying energy to a recording medium and a test writing method which obtains optimum writing power under high-speed recording conditions correctly in a short period in an information recording device. <P>SOLUTION: It makes test writing of even-number length marks and odd-number length marks separately in a 2T system strategy to find optimum writing power for each case. Since the precision of the test writing can be improved, it is possible to obtain excellent recording characteristics. <P>COPYRIGHT: (C)2006,JPO&NCIPI |
