| 发明名称 |
ELECTRO-OPTICAL MEASUREMENT OF HYSTERESIS IN INTERFEROMETRIC MODULATORS |
| 摘要 |
Disclosed herein are methods and apparatus for testing interferometric modulators. The interferometric modulators may be tested by applying a time-varying voltage stimulus (100) and measuring the resulting reflectivity (102) from the modulators. |
| 申请公布号 |
KR20060092870(A) |
申请公布日期 |
2006.08.23 |
| 申请号 |
KR20050084149 |
申请日期 |
2005.09.09 |
| 申请人 |
IDC, LLC |
发明人 |
CUMMINGS WILLIAM J.;GALLY BRIAN JAMES |
| 分类号 |
G01R33/14 |
主分类号 |
G01R33/14 |
| 代理机构 |
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代理人 |
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| 主权项 |
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| 地址 |
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