发明名称 WAFER, EPITAXIAL FILTER, AND METHOD OF MANUFACTURE THEREOF
摘要 <p>Provided is a silicon wafer which is stabilized in quality exerting no adverse influence on device characteristics and manufactured by restricting a boron contamination from the environment, and a manufacturing process therefor. Concretely, the silicon wafer is characterized by an attached boron amount thereon being 1 x 10<10> atoms/cm<2> or less. In order to manufacture such a wafer as contains a small amount of boron attached on the wafer surface, the wafer is treated in an atmosphere of boron concentration of 15 ng/m<3> or less. Boron-less filters and boron adsorbing filters are used as filters in a clean room and the like so as to lower the boron concentration in the atmosphere. <IMAGE></p>
申请公布号 EP1143047(A4) 申请公布日期 2006.08.23
申请号 EP20000961105 申请日期 2000.09.20
申请人 SHIN-ETSU HANDOTAI CO., LTD 发明人 MARUYAMA, FUMIAKI;NAITO, NAOKI;UCHIYAMA, ATSUO
分类号 C30B25/02;F24F3/16;H01L21/205;(IPC1-7):C30B29/06;F24F7/06;H01L21/02 主分类号 C30B25/02
代理机构 代理人
主权项
地址
您可能感兴趣的专利