发明名称 Methods for designing bond pad rerouting elements for use in stacked semiconductor device assemblies and for assembling semiconductor devices
摘要 A rerouting element for a semiconductor device that includes a dielectric film that carries conductive vias, conductive elements, and contact pads. The conductive vias are positioned at locations that correspond to the locations of bond pads of a semiconductor device with which the rerouting element is to be used. The conductive elements, which communicate with corresponding conductive vias, reroute the bond pad locations to corresponding contact pad locations adjacent to one peripheral edge or two adjacent peripheral edges of the rerouted semiconductor device. The rerouting element is particularly useful for rerouting centrally located bond pads of a semiconductor device, as well as for rerouting the peripheral locations of bond pads of a semiconductor device to one or two adjacent peripheral edges thereof. Methods for designing and using the rerouting element are also disclosed, as are semiconductor device assemblies including one or more rerouting elements.
申请公布号 US7094631(B2) 申请公布日期 2006.08.22
申请号 US20030646420 申请日期 2003.08.22
申请人 MICRON TECHNOLOGY, INC. 发明人 CORISIS DAVID J.;BROOKS JERRY M.;SCHWAB MATT E.;REYNOLDS TRACY V.
分类号 H01L21/44;H01L21/48;H01L21/50;H01L25/065 主分类号 H01L21/44
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