发明名称 |
Semiconductor integrated circuit having functional modules each including a built-in self testing circuit |
摘要 |
A semiconductor integrated circuit that allows a self test of an integrated circuit built into a system to be conducted through a circuit structure on a smaller scale and achieves an improvement in the accuracy of the self test is provided. An integrated circuit includes functional modules respectively provided with built-in self testing circuits and a self test control circuit that individually controls the built-in self testing circuits. This structure allows self tests to be automatically performed within the integrated circuit without requiring external components. The scale of the system having the built-in integrated circuit may thus be reduced. Also, by building up the built-in self testing circuits in the individual functional modules to a sufficient degree, a high-quality self test comparable to that conducted prior to shipment can be performed even after the integrated circuit is built into the system.
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申请公布号 |
US7096386(B2) |
申请公布日期 |
2006.08.22 |
申请号 |
US20020246636 |
申请日期 |
2002.09.19 |
申请人 |
OKI ELECTRIC INDUSTRY CO., LTD. |
发明人 |
OZAWA KAZUMASA |
分类号 |
G06F11/00;G01R31/3167;G01R31/317;G01R31/3185;G11C29/14 |
主分类号 |
G06F11/00 |
代理机构 |
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代理人 |
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地址 |
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