发明名称 Method for determining the critical path of an integrated circuit
摘要 A method of determining the critical path of a circuit includes first determining the paths, their mean path transit times and their path transit time fluctuations. Paths having similar statistical parameters are combined to form one path group. For each path group, a statistical group figure is, then, calculated and, for the totality of paths considered, a statistical total figure is calculated. Finally, the critical paths of the circuit are determined by taking into consideration the total figure, comparing the group figures at or above a critical path transit time Tc.
申请公布号 US7096443(B2) 申请公布日期 2006.08.22
申请号 US20030620093 申请日期 2003.07.15
申请人 INFINEON TECHNOLOGIES AG 发明人 BERTHOLD JOERG;LORCH HENNING;EISELE MARTIN
分类号 G06F17/50;G01R23/175;G01R31/317;G06F11/26;G06F19/00 主分类号 G06F17/50
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