发明名称 |
CELL FOR MEASUREMENT OF DIELECTRIC PARAMETERS OF THIN FILMS OF COMPLEX OXIDES |
摘要 |
FIELD: measurement of dielectric parameters of thin films of complex oxides used in manufacture of lithium - ion cells. ^ SUBSTANCE: a film pattern of electrodes of nickel, copper or aluminum in the form of comb-like electrodes is applied onto the supporting structure of glass ceramic or polycor through a mask by vacuum spraying. A film of complex oxide is applied onto the surface of the contours. The electrodes are made of metal applied on the supporting structure in the form of comb-like contours with the combs directed toward one another, inserted one in the other and coated by a thin film 0.3 - to 0.9mum thick. ^ EFFECT: enhanced precision of measurement, provided multiple use of cells. ^ 3 ex, 3 tbl, 2 dwg |
申请公布号 |
RU2282203(C1) |
申请公布日期 |
2006.08.20 |
申请号 |
RU20050110324 |
申请日期 |
2005.04.08 |
申请人 |
GOSUDARSTVENNOE OBRAZOVATEL'NOE UCHREZHDENIE VYSSHEGO PROFESSIONAL'NOGO OBRAZOVANIJA "SIBIRSKIJ GOSUDARSTVENNYJ TEKHNOLOGICHESKIJ UNIVERSITET";INSTITUT KHIMII I KHIMICHESKOJ TEKHNOLOGII SIBIRSKOGO OTDELENIJA ROSSIJSKOJ AKADEMII NAUK |
发明人 |
SUKHOVA GALINA IVANOVNA;PATRUSHEVA TAMARA NIKOLAEVNA;CHUDINOV EVGENIJ ALEKSEEVICH;MEN'SHIKOV VIKTOR VASIL'EVICH;PATRUSHEV VALERIJ VASIL'EVICH |
分类号 |
G01R27/26 |
主分类号 |
G01R27/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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